Thursday 20 October 2016
2 sessions:
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Event Overview
Spectroscopic Ellipsometry is an efficient and non-destructive method for extracting optical constants of materials in the UV-Vis-NIR wavelength ranges. The optical constants (n,k) of a material are among the most important sets of optical data and are specific to the material being studied.
During this webinar, you will learn how to define a strategy to perform quantitative Spectroscopic Ellipsometry on CIGS semiconducting thin films. CIGS is among the most efficient absorbers for photovoltaic solar conversion. Deployed as thin or ultra thin films, CIGS optical characterization is as important in its preparation stage as in the modeling of cell stacks. However the determination of CIGS optical constants is a very complex challenge, particularly for SE when it is used as a unique and direct experimental method.
Key Learning Objectives
Who Should Attend?
Presenters
Dr Arnaud Etcheberry, Director of Lavoisier Institute, Versailles, France
Céline Eypert, Application Specialist at HORIBA Scientific